Skip to content
(55) 5660-9828
ventas@microanalisis.mx
ES
EN
Menu
ES
EN
Home
Catalog
Metallographic sample preparation
Sectioning
Mounting/Encapsulation
Grinding and polishing
Petrography
Microscopes and image analysis
Metallographic microscopes
Stereoscopic microscopes
Polarized light microscopes
Biological microscopes
Image analysis systems
Digital cameras
Hardness testing
Rockwell
Brinell
Vickers
Universal
Plastics
Portables
Custom systems
Leeb
Mechanical tests
Universal machines
Impact pendulums
Force systems
Torque systems
Other
Company
Principals
Contact
Menu
Home
Catalog
Metallographic sample preparation
Sectioning
Mounting/Encapsulation
Grinding and polishing
Petrography
Microscopes and image analysis
Metallographic microscopes
Stereoscopic microscopes
Polarized light microscopes
Biological microscopes
Image analysis systems
Digital cameras
Hardness testing
Rockwell
Brinell
Vickers
Universal
Plastics
Portables
Custom systems
Leeb
Mechanical tests
Universal machines
Impact pendulums
Force systems
Torque systems
Other
Company
Principals
Contact
Home
Catalog
Metallographic sample preparation
Sectioning
Grinding and polishing
Mounting/Encapsulation
Petrography
Microscopes and image analysis
Biological microscopes
Polarized light microscopes
Stereoscopic microscopes
Metallographic microscopes
Image analysis systems
Digital cameras
Hardness testing
Brinell
Leeb
Plastics
Portables
Rockwell
Custom systems
Universal
Vickers
Mechanical tests
Universal machines
Impact pendulums
Force systems
Torque systems
Other
Company
Principals
Contact
ES
EN
Menu
Home
Catalog
Metallographic sample preparation
Sectioning
Grinding and polishing
Mounting/Encapsulation
Petrography
Microscopes and image analysis
Biological microscopes
Polarized light microscopes
Stereoscopic microscopes
Metallographic microscopes
Image analysis systems
Digital cameras
Hardness testing
Brinell
Leeb
Plastics
Portables
Rockwell
Custom systems
Universal
Vickers
Mechanical tests
Universal machines
Impact pendulums
Force systems
Torque systems
Other
Company
Principals
Contact
ES
EN
PULSTEC
Analizador de esfuerzos residuales por rayos X
Detalles:
Modelo: μ-X360s
Marca Pulstec
Técnicas: Mediciones: Esfuerzo residual, Ancho total a kitad de máximo y austenita retenida.
Referencia: Salidsa de rayos X de baja potencia (30 kV, 1.5 mA).
Solicitar información
Otros productos:
Vibrotech 300
Ver producto
Resinas para vaciado
Ver producto
Z730
Ver producto
ARM
Ver producto
Principals
Previous
Next
Solicitar información del producto
Name
Email
Phone
Mensaje
Send